RF E-field Sensing Using Rydberg Atom-Based Microwave Electrometry
MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA
Authors: Monika; Rawat, Harish Singh; Dubey, Satya Kesh
Abstract
In this work, a microwave field is sensed by rubidium atoms instead of a conventional antenna like dipole or horn antenna. Microwave field is projected onto a glass cell containing Rb vapors which act as an antenna in this case. A four-level ladder atomic system is considered for analytical solution, and E-field measurement is reported by utilizing quantum phenomena like electromagnetically induced transparency and Autler-Townes splitting. It has been shown that atoms can also sense weak microwave field with this approach. The amplitude measurement of microwave E-field is changed to frequency measurement, and E-field is evaluated by monitoring the frequency difference between two EIT peaks. Measurement results are reported for variable input microwave power at frequency 15.09 GHz varying from 12.5 mu W to 4 mW generated from synthesized signal generator. Moreover, the effect on the EIT resonance due to the distance variation of the source antenna is also discussed. The microwave frequency is detuned from the resonant frequency, and results are reported in this work.
Temperature Dependent Performance Evaluation and Linearity Analysis of Double Gate-all-around (DGAA) MOSFET: an Advance Multigate Structure
SILICON
Authors: Pratap, Yogesh; Verma, Jay Hind Kumar
Abstract
Multi-gate devices such as double gate, FinFET and Gate-All-Around (GAA) are potential candidates to achieve the performance expected by semiconductor association. This paper presents an analog/RF performance and linearity distortion analysis for an advance multigate structure named Double Gate-All-Around (DGAA) MOSFET. Temperature dependent characteristics of the DGAA MOSFET have also been investigated in detail from 200 K to 400 K. A comparative analysis between Gate-All-Around (GAA) and DGAA MOSFETs with impact of silicon film thickness is analyzed by using 3-D ATLAS TCAD device simulator. It is demonstrated that depending on gate voltage, DGAA MOSFET has larger value of drain current (I-ds), transconductance (g(m)) and gain. Results demonstrate that drain current, transconductance, device gain and transconductance to drain current ratio (g(m)/I-ds) improves when temperature is decreased. DGAA MOSFET shows improvement in analog/RF performance, suppressed Short Channel Effects (SCEs) and harmonics distortions due to more gate controllability on the channel charge.