Significant association of EED promoter hypomethylation with colorectal cancer
ONCOLOGY LETTERS
Authors: Ying, Xiuru; Pan, Ranran; Zhong, Jie; Wu, Boyi; Jiang, Yuting; Ying, Jieer; Zhou, Cong; Dai, Jie; Zhao, Shuangying; Shen, Yinan; Zhang, Wei; Duan, Shiwei
Abstract
Colorectal cancer (CRC) is one of the most common and serious types of malignancy worldwide. The embryonic ectoderm development (EED) gene is important to maintain transcriptional repressive states of genes over successive cell generations. The present study aimed to investigate the association between EED methylation and CRC. A total of 111 CRC tissue samples, 111 paired para-tumor tissues and 20 colorectal normal tissues were obtained for EED methylation assay, which was performed using a quantitative methylation-specific polymerase chain reaction. The percentage of methylated reference was calculated to represent the DNA methylation level. A dual-luciferase reporter gene assay was used to detect the gene promoter activity of a EED fragment. The current results revealed a significant difference in the EED methylation levels among tumor, para-tumor and normal colorectal tissues (tumor vs. para-tumor vs. normal, 5.03 +/- 4.61 vs. 8.65 +/- 11.50 vs. 40.12 +/- 45.31; F=45.014; P<0.0001). The dual-luciferase reporter gene assay demonstrated that the transcriptional activity of recombinant pGL3-EED plasmid was significantly higher compared with that of the pGL3-Basic control vector (fold-change, 3.15; P=0.014), which suggests the EED fragment can promote gene expression. In conclusion, the present study demonstrated that EED hypomethylation may be an important factor associated with CRC.
Pin-pin ESD protection for electro-explosive device under severe human body ESD
MICROELECTRONICS RELIABILITY
Authors: Lv, Zhixing; Yan, Nan; Bao, Bingliang
Abstract
Electrostatic discharge (ESD) may introduce huge damages to electro-explosive devices (EEDs). This paper studies the pin-pin ESD protection for EED under server human body ESD. We use the PSpice and MATLAB to simulate the ESD of EED protected with transient voltage suppressor (TVS), varistor, semiconductor arrester and capacitance. Moreover, we achieve the decay time, current waveforms, voltage waveforms and energy integration waveforms of the EED during the ESD, with different protections. Simulation results reveal that TVS succeeded in protecting bridgewire EED against the pin-pin ESD, while other three did not provide adequate protection. The pin-pin ESD experiments have been performed using the TVS and varistor. Experimental results show that, using the TVS protection, the EED is not firing under the severe 50 kV ESD voltage. However, by using varistor protection, the ESD protection capability increases by more than 90%, while the protection capability only enhances by 3.1%. The response time of the TVS, i.e. 10(-12) s, is much faster than that of the varistor, i.e. 10(-8) s. (C) 2017 Elsevier Ltd. All rights reserved.