Human ESD ELISA Matched Antibody Pair

Background/Aims: The relationship between the serum pepsinogen (sPG) level and changes in gastric mucosa has been well studied. Here, we evaluated the usefulness of sPG (I, II, I/II ratio) and intragastric pH as a biomarker of severe gastric atrophy in gastric neoplastic lesions. Methods: A total of 186 consecutive Korean patients with gastric neoplastic lesions underwent endoscopic submucosal dissection (ESD) in this study. The serologic atrophy group had sPG I level <= 70 ng/rnL and an sPG I/II ratio <= 3.0. Before ESD, overnight fasting venous blood and gastric juice samples were collected to measure the sPG level and intragastric pH. The degree of gastric atrophy was estimated by endoscopy, and the rapid urease test was performed to investigate Helicobacter pylori infection. Results: Patients who met the criteria of serologic atrophy showed more severe endoscopic atrophic changes (61% vs. 18%, p = 0.000). Older patients and those with more atrophic changes at the gastric upper body demonstrated both a lower sPG I level and a lower PG I/II ratio and more severe endoscopic atrophy. The sPG I/II ratio was the lowest in low grade dysplasia than in high grade dysplasia and early gastric cancer (EGC) (p = 0.015). In addition, patients who tested negative for serologic atrophy and H. pylori showed the lowest intragastric pH (p = 0.000). Conclusions: A low sPG I level and a low I/II ratio were correlated with the severity of gastric atrophy in gastric neoplastic lesions, thus indicating it to be a sensitive biomarker of gastric precancerous lesions or EGC.

Electrostatic discharge (ESD)-induced soft failures are a critical issue for electronic systems as the failures are mostly found after the hardware design is completed. Any changes applied to the hardware may delay the project. Diagnostic tools capable of identifying soft failure-induced malfunctions in an early stage of product design help to reduce the risk of late stage ESD-induced project delays. In many cases, soft failures can be directly observed by the user interface, system crash, or other obvious indicators. However, in an early product design stage the operation system may be marginal and applications may not be available. To improve the ability to detect soft failure critical design choices, this paper presents several methods to identify ESD-induced changes which may not be observable via direct observation. These methods include the observation of ac or dc currents, monitoring dc voltages, capturing near fields and processing them via short-term fast fourier transform (FFT), wavelet transformation, down mixing to audible range, and monitoring for latch-up via thermal imaging. The paper introduces the basis of each method, shows examples, and compares them for their detection ability.